X. D\'efago, P. Urb\'an, N. Hayashibara, and T. Katayama, "On Accrual Failure Detectors," Research Report, IS-RR-2004-011, Japan Advanced Institute of Science and Technology, May 2004.
ID 67
分類 テクニカルレポート
タグ accrual detectors failure
表題 (title) On Accrual Failure Detectors
表題 (英文)
著者名 (author) Xavier D\'efago,Peter Urb\'an,Naohiro Hayashibara,Takuya Katayama
英文著者名 (author) ,,Naohiro Hayashibara,Takuya Katayama
キー (key) ,,Naohiro Hayashibara,Takuya Katayama
号数 (number) IS-RR-2004-011
技術報告書の種別 (type) Research Report
発行元組織 (organization) Japan Advanced Institute of Science and Technology
出版社住所 (address)
刊行月 (month) 5
出版年 (year) 2004
URL http://hdl.handle.net/10119/4785
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) Traditionally, failure detectors have considered a binary model whereby a given process can be either trusted or suspected. This paper defines a family of failure detectors, called accrual failure detectors, that revisits this interaction model. Accrual failure detectors associate to each process a real value representing a suspicion level. An important advantage of accrual failure detectors over binary ones is to allow distributed applications to trigger different actions depending on the suspicion level. For instance, an application can take precautionary measures when the suspicion level reaches a given level, and then take more drastic actions after it raises above a second (much higher) level. The paper defines accrual failure detectors and their basic properties. Four classes of accrual failure detectors are discussed, each of which is proved equivalent to a class of binary unreliable failure detectors (P, S, ◇P, and ◇S)
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BiBTeXエントリ
@techreport{id67,
         title = {On accrual failure detectors},
        author = {Xavier D\'efago and Peter Urb\'an and Naohiro Hayashibara and Takuya Katayama},
        number = {IS-RR-2004-011},
          type = {Research Report},
    institution = {Japan Advanced Institute of Science and Technology},
         month = {5},
          year = {2004},
}