国際会議
[1] Naohiro Hayashibara, Xavier Defago, Rami Yared, and Takuya Katayama, "The φ Accrual Failure Detector," In Proc. of the 23rd IEEE International Symposium on Reliable Distributed Systems (SRDS-23), pages 66-78, October 2004.
テクニカルレポート
[1] Naohiro Hayashibara, Xavier D\efago, Rami Yared, and Takuya Katayama, "The φ accrual failure detector," Research Report, number IS-RR-2004-010, Japan Advanced Institute of Science and Technology, May 2004.